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Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

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    Buy cheap Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1 from wholesalers
     
    Buy cheap Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1 from wholesalers
    • Buy cheap Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1 from wholesalers
    • Buy cheap Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1 from wholesalers

    Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

    Ask Lasest Price
    Brand Name : PEGO GROUP
    Model Number : PG-TP
    Certification : Third-Lab Calibration Certificate
    Price : USD300~USD10000
    Payment Terms : T/T, Western Union, MoneyGram
    Delivery Time : 7 working days
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    Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

    IEC60950-1 Test Probe Kits (Wedge Probe, Jointed Test Finger, Rigid Test Finger and Test Pin)


    1. Introduction

    The test probe kits are meet the requirement of IEC60950-1, includes jointed test finger, test pin, unjointed test finger, TNV test probe and wedge probe, they are applied to test the person’s protection from live parts and hazardous parts of information technology equipment.


    2. Specification

    NameFigure numberParameter
    Jointed test finger (test probe B)

    IEC60950-1 figure 2A

    IEC61032 figure 2

    Purpose:Protection of person’s finger from live parts

    Specification:

    1). Diameter of dactylogryposis: Φ12mm

    2). Length of dactylogryposis: 80mm

    3). Diameter of baffle. Φ50mm

    4). Length of baffle: 100mm

    Test pin (test probe 13)

    IEC60950-1 figure 2B

    IEC61032 figure 9

    Purpose: Protection against access to hazardous live parts in class 0 equipment and class II equipment

    Specification:

    1). Diameter: Φ3mm (head), Φ4mm (tails)

    2). Length of probe: 15mm

    3). Diameter of baffle: Φ25mm

    4). Thickness of baffle: 4mm

    Test probeIEC60950-1 figure 2C

    Purpose: Protection against access to bare parts of TNV circuits.

    Specification:

    1). Diameter of the probe: Φ12mm

    2). Length of the probe: 80mm

    3). Diameter of baffle: Φ50mm

    4). Thickness of baffle: 5mm

    Straight unjointed test finger with 30N force (test probe 11)

    IEC60950-1 clause 2.1.1.1

    IEC61-32 figure 7

    Purpose: protection of persons against access to hazardous parts

    Specification: the size is as same as test probe B, but without joints, 30N force is applied.

    Wedge probeIEC60950-1 figure EE.1 and EE.2

    Purpose:protection from contact hazardous moving parts, including the shredding rollers/mechanisms.

    Specification:

    1). Diameter of the probe: Φ50mm

    2). Length of the probe: 300mm

    3). Length of first tip: 30mm

    4). Length of second tip: 60mm

    5). Length of third tip: 100mm


    3. COMPETITIVE ADVANTAGE
    1). PEGO is professional on electrical lab testing equipment, our goal is to provide our customers with better price, better quality and better service.
    2). Customized Service: We can help our customers to design and develop new equipment according to their requirement. We are flexible and capable Supplier.
    3).Excellent Quality: 12 months warranty, 100% guarantee test before delivery. And all our products can pass the third-lab calibration which is authorized by ISO17025.
    4). After Sales Service and Technical Assistance: 24 hours technical support by email. Our professional team is always here willing to be your technical consultant.
    5). Quick Delivery: Our company provides just-in-time delivery, and our freight forwarder can provide transportation services at the most reasonable price to solve your worries.
    6). Prompt Response to Customers: we promise to reply our customers within 24 hours

    Product Tags:

    finger probe test

      

    ul test finger

      
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